Sputter yields of ammonium chloride and solid glycerol

Greg Gillen; J. W. Christiansen; I. S T Tsong; B. Kimball; Peter Williams; R. Graham Cooks

doi:10.1002/rcm.1290020404

Sputter yields of ammonium chloride and solid glycerol

Greg Gillen, J. W. Christiansen, I. S T Tsong, B. Kimball, Peter Williams, R. Graham Cooks

Molecular Sciences, School of (SMS)

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

We have measured the sputtering yields of ammonium chloride and of frozen glycerol films under 8 keV Ar^+˙ bombardment using a thin film depth profiling technique. The sputtering yield of ammonium chloride was 34±3 molecules (NH₄Cl)/ion; for frozen glycerol the sputter yield was 54±9 molecules/ion. The results constrain possible mechanisms of damage suppression in organic secondary ion mass spectrometry.

Original language	English (US)
Pages (from-to)	67-68
Number of pages	2
Journal	Rapid Communications in Mass Spectrometry
Volume	2
Issue number	4
DOIs	https://doi.org/10.1002/rcm.1290020404
State	Published - Apr 1988

ASJC Scopus subject areas

Analytical Chemistry
Spectroscopy
Organic Chemistry

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10.1002/rcm.1290020404

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title = "Sputter yields of ammonium chloride and solid glycerol",

abstract = "We have measured the sputtering yields of ammonium chloride and of frozen glycerol films under 8 keV Ar+˙ bombardment using a thin film depth profiling technique. The sputtering yield of ammonium chloride was 34±3 molecules (NH4Cl)/ion; for frozen glycerol the sputter yield was 54±9 molecules/ion. The results constrain possible mechanisms of damage suppression in organic secondary ion mass spectrometry.",

author = "Greg Gillen and Christiansen, {J. W.} and Tsong, {I. S T} and B. Kimball and Peter Williams and Cooks, {R. Graham}",

year = "1988",

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AU - Gillen, Greg

AU - Christiansen, J. W.

AU - Tsong, I. S T

AU - Kimball, B.

AU - Williams, Peter

AU - Cooks, R. Graham

PY - 1988/4

Y1 - 1988/4

N2 - We have measured the sputtering yields of ammonium chloride and of frozen glycerol films under 8 keV Ar+˙ bombardment using a thin film depth profiling technique. The sputtering yield of ammonium chloride was 34±3 molecules (NH4Cl)/ion; for frozen glycerol the sputter yield was 54±9 molecules/ion. The results constrain possible mechanisms of damage suppression in organic secondary ion mass spectrometry.

AB - We have measured the sputtering yields of ammonium chloride and of frozen glycerol films under 8 keV Ar+˙ bombardment using a thin film depth profiling technique. The sputtering yield of ammonium chloride was 34±3 molecules (NH4Cl)/ion; for frozen glycerol the sputter yield was 54±9 molecules/ion. The results constrain possible mechanisms of damage suppression in organic secondary ion mass spectrometry.

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JF - Rapid Communications in Mass Spectrometry

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ER -

Sputter yields of ammonium chloride and solid glycerol

Abstract

ASJC Scopus subject areas

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