Spatial Resolution in Aloof EELS

Ray Egerton; Yifan Wang; Peter A. Crozier

doi:10.1093/micmic/ozad067.169

Spatial Resolution in Aloof EELS

Ray Egerton, Yifan Wang, Peter A. Crozier

Engineering, Ira A. Fulton Schools of (IAFSE)

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	362-364
Number of pages	3
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.169
State	Published - Jul 22 2023

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1093/micmic/ozad067.169

Cite this

@article{3fc6e4ffe764445e9aee1b54e9b987a4,

title = "Spatial Resolution in Aloof EELS",

author = "Ray Egerton and Yifan Wang and Crozier, {Peter A.}",

year = "2023",

month = jul,

day = "22",

doi = "10.1093/micmic/ozad067.169",

language = "English (US)",

volume = "29",

pages = "362--364",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "1",

}

TY - JOUR

T1 - Spatial Resolution in Aloof EELS

AU - Egerton, Ray

AU - Wang, Yifan

AU - Crozier, Peter A.

PY - 2023/7/22

Y1 - 2023/7/22

UR - http://www.scopus.com/inward/record.url?scp=85168609719&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85168609719&partnerID=8YFLogxK

U2 - 10.1093/micmic/ozad067.169

DO - 10.1093/micmic/ozad067.169

M3 - Article

C2 - 37613395

AN - SCOPUS:85168609719

SN - 1431-9276

VL - 29

SP - 362

EP - 364

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 1

ER -

Spatial Resolution in Aloof EELS

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this