Abstract
We present experimental results for two types of quantum dots, which are embedded within a silicon metal-oxide-semiconductor structure. Evidence is found for single-electron charging at low temperature, and for an asymmetric shape of the dot. First results of simulations of these dots are presented.
Original language | English (US) |
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Pages (from-to) | 415-421 |
Number of pages | 7 |
Journal | Applied Physics A: Materials Science and Processing |
Volume | 71 |
Issue number | 4 |
DOIs | |
State | Published - Oct 2000 |
ASJC Scopus subject areas
- Chemistry(all)
- Materials Science(all)