Shape stability of TiSi2 islands on Si (111)

W. C. Yang, H. Ade, R. J. Nemanich

Research output: Contribution to journalArticlepeer-review

21 Scopus citations


Photoelectron emission microscopy (PEEM), which has the capability of hih-temperature in situ growth an real time imaging, is employed to observe the dynamics of shape transitions of TiSi2 islands on Si(111) surfaces. In particular, the elongation of initially nearly circular islands into wire structures an dimensional variation of the evolving islands is observed. As such, different cross-sectional shapes of the elongated islands are found.

Original languageEnglish (US)
Pages (from-to)1572-1576
Number of pages5
JournalJournal of Applied Physics
Issue number3
StatePublished - Feb 1 2004
Externally publishedYes

ASJC Scopus subject areas

  • General Physics and Astronomy


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