Scanning force microscope study of detachment of nanometer adhering particulates

J. T. Dickinson, R. F. Hariadi, L. Scudiero, S. C. Langford

Research output: Contribution to journalConference articlepeer-review

Abstract

We employ salt particles deposited on soda lime glass substrates as a model system for particle detachment in chemically active environments. The chemical activity is provided by water vapor, and detachment is performed with the tip of a scanning force microscope. The lateral force required to detach nanometer-scale salt particles is a strong function of particle size and relative humidity. The peak lateral force at detachment divided by the nominal particle area yields an effective interfacial shear strength. The variation of shear strength with particle size and humidity is described in terms of chemically assisted crack growth along the salt/glass interface.

Original languageEnglish (US)
Pages (from-to)182-186
Number of pages5
JournalMaterials Science and Engineering A
Volume288
Issue number2
DOIs
StatePublished - 2000
Externally publishedYes
EventE-MRS Symposium H-strain in Materials: Analysis, Relaxation and Properties (Joint Symposium with FEMS) - Strasbourg, France
Duration: Jun 1 1999Jun 4 1999

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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