TY - GEN
T1 - Sampling Methods for Toxicity Testing of PV Modules for End-of-Life Decisions
AU - Tamizhmani, Govinda Samy
AU - Shaw, Stephanie
AU - Libby, Cara
AU - Sinha, Parikhit
AU - Curtis, Telia
AU - Tatapudi, Sai
AU - Bicer, Bulent
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/6/20
Y1 - 2021/6/20
N2 - The present work is a continuation of our research studies published at the IEEE PVSC in 2018 and 2019. In 2018 and 2019, we reported mechanical cutting and waterjet cutting methods, respectively, to remove samples from PV modules for TCLP (Toxicity Characteristics Leaching Procedure) testing. Based on the encouraging results obtained in the waterjet cutting method with lower variability in the TCLP results, we have now extended our waterjet cutting and toxicity testing efforts: to confirm if chemical leaching or contamination occurs during the waterjet sample removal process; to include the thin-film technologies to explore new avenues which could reduce the complexity of the current waterjet procedure; to compare TCLP results between fresh and field-aged modules; and to eventually develop a database for TCLP test results.
AB - The present work is a continuation of our research studies published at the IEEE PVSC in 2018 and 2019. In 2018 and 2019, we reported mechanical cutting and waterjet cutting methods, respectively, to remove samples from PV modules for TCLP (Toxicity Characteristics Leaching Procedure) testing. Based on the encouraging results obtained in the waterjet cutting method with lower variability in the TCLP results, we have now extended our waterjet cutting and toxicity testing efforts: to confirm if chemical leaching or contamination occurs during the waterjet sample removal process; to include the thin-film technologies to explore new avenues which could reduce the complexity of the current waterjet procedure; to compare TCLP results between fresh and field-aged modules; and to eventually develop a database for TCLP test results.
UR - http://www.scopus.com/inward/record.url?scp=85115940787&partnerID=8YFLogxK
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U2 - 10.1109/PVSC43889.2021.9518620
DO - 10.1109/PVSC43889.2021.9518620
M3 - Conference contribution
AN - SCOPUS:85115940787
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1871
EP - 1875
BT - 2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Y2 - 20 June 2021 through 25 June 2021
ER -