Sampling Methods for Toxicity Testing of PV Modules for End-of-Life Decisions

Govinda Samy Tamizhmani, Stephanie Shaw, Cara Libby, Parikhit Sinha, Telia Curtis, Sai Tatapudi, Bulent Bicer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


The present work is a continuation of our research studies published at the IEEE PVSC in 2018 and 2019. In 2018 and 2019, we reported mechanical cutting and waterjet cutting methods, respectively, to remove samples from PV modules for TCLP (Toxicity Characteristics Leaching Procedure) testing. Based on the encouraging results obtained in the waterjet cutting method with lower variability in the TCLP results, we have now extended our waterjet cutting and toxicity testing efforts: to confirm if chemical leaching or contamination occurs during the waterjet sample removal process; to include the thin-film technologies to explore new avenues which could reduce the complexity of the current waterjet procedure; to compare TCLP results between fresh and field-aged modules; and to eventually develop a database for TCLP test results.

Original languageEnglish (US)
Title of host publication2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages5
ISBN (Electronic)9781665419222
StatePublished - Jun 20 2021
Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
Duration: Jun 20 2021Jun 25 2021

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371


Conference48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Country/TerritoryUnited States
CityFort Lauderdale

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering


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