Abstract
Graphene is a novel new material with an unusual zero-gap band structure, where electrons and holes are closely connected through a relativistic Dirac equation. It is of interest to study the various scattering mechanisms and the transport through device structures fabricated on this new material. Here, we use Rode's method to study the transport through gated graphene devices. The results are compared with recent results obtained for both back-gates and electrochemical gates. The transport is dominated by the trapped charge at the graphene-SiO2, but phonon scattering is shown to be important.
Original language | English (US) |
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Pages (from-to) | 43-50 |
Number of pages | 8 |
Journal | Journal of Computational Electronics |
Volume | 8 |
Issue number | 2 |
DOIs | |
State | Published - 2009 |
Keywords
- Carrier puddles
- Graphene
- Impurity scattering
- Surface roughness scattering
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Modeling and Simulation
- Electrical and Electronic Engineering