Role of scanning probe microscopes in the development of nanoelectric devices

Arunava Majumdar, Stuart Lindsay

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


The last six years have witnessed the rapid development of several techniques of nanometer and atomic scale material manipulation using scanning probe microscopes (SPM). A stage has now been reached where we can explore the possibilities of using this technology to make practical nanometer-scale electronic devices. We feel that there are two key elements to this issue-(i) a nano-device must be physically accessible to the macro-world; and (ii) a nano-device that exploits quantum phenomena should be electronically accessible and should operate under ambient conditions. In view of this, the first part of the paper is devoted to discussing the different SPM lithographic techniques that will form the physical interface between the micrometer and the nanometer scales. The second part critically explores the possibilities of using SPM for developing molecular electronic devices, arguing that their small size may allow single-electron effects to be exploited at ambient temperatures.

Original languageEnglish (US)
Article number1031004
Pages (from-to)33-57
Number of pages25
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Oct 3 1993
EventTechnology of Proximal Probe Lithography 1993 - Bellingham, United States
Duration: Oct 3 1993 → …

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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