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Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design
Brian R. Wier, Rafael Perez Martinez, Uppili S. Raghunathar, Hanbin Ying, Saeed Zeinolabedinzadeh, John D. Cressler
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
3
Scopus
citations