TY - GEN
T1 - Reliability Analysis of Field-aged Glass/Glass PV Modules
T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
AU - Thorat, Prathamesh Manohar
AU - Waghmare, Shreyas Prasad
AU - Sinha, Archana
AU - Kumar, Akash
AU - Tamizhmani, Govinda Samy
N1 - Funding Information:
This project was funded by the US Department of Energy with award number DE-EE0008565
Publisher Copyright:
© 2020 IEEE.
PY - 2020/6/14
Y1 - 2020/6/14
N2 - This paper presents a preliminary reliability analysis of field-aged glass/glass (G/G) PV modules. Several characterization tests were performed on more than 60 modules with two different encapsulant types (EVA and ionomer) exposed in hot-dry Arizona (AZ) climate over 10-35 years. The common degradation mode observed in both encapsulant types was the delamination of encapsulant along with encapsulant browning (EVA only), glass cracking (EVA only), and metallic corrosion over junction box area (ionomer only). The EVA encapsulated G/G modules showed the higher median power degradation rate at 0.91-1.99%/yr whereas modules with ionomer showed the lower at 0.21%/yr.
AB - This paper presents a preliminary reliability analysis of field-aged glass/glass (G/G) PV modules. Several characterization tests were performed on more than 60 modules with two different encapsulant types (EVA and ionomer) exposed in hot-dry Arizona (AZ) climate over 10-35 years. The common degradation mode observed in both encapsulant types was the delamination of encapsulant along with encapsulant browning (EVA only), glass cracking (EVA only), and metallic corrosion over junction box area (ionomer only). The EVA encapsulated G/G modules showed the higher median power degradation rate at 0.91-1.99%/yr whereas modules with ionomer showed the lower at 0.21%/yr.
KW - browning
KW - delamination
KW - encapsulant degradation
KW - field exposed
KW - glass/glass
KW - reliability
UR - http://www.scopus.com/inward/record.url?scp=85099577998&partnerID=8YFLogxK
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U2 - 10.1109/PVSC45281.2020.9300551
DO - 10.1109/PVSC45281.2020.9300551
M3 - Conference contribution
AN - SCOPUS:85099577998
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1816
EP - 1822
BT - 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 15 June 2020 through 21 August 2020
ER -