Reflection electron microscopy studies of GaP(110) surfaces in UHV-TEM

M. Gajdardziska-Josifovska, Martha McCartney, David Smith

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


Reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) were used in a UHV electron microscope to study the effects of various surface treatments on the topography and crystal structure of cleaved GaP(110) surfaces. Reported ion-milling and annealing cleaning treatments resulted in rough surface topography, and in good 1 × 1 RHEED patterns. Annealing at 800°C resulted in surface smoothing, but also led to dissociation of GaP with viscous flow of a Ga-rich molten phase on the surface. Regions on the surface which were not covered by the molten phase maintained the 1 × 1 reconstruction typical of the clean GaP(110) surface.

Original languageEnglish (US)
Pages (from-to)1062-1066
Number of pages5
JournalSurface Science
Issue numberPART 2
StatePublished - May 10 1993

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


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