Recovery in dc performance of off-state step-stressed AlGaN/GaN high electron mobility transistor with thermal annealing

Byung Jae Kim, Shihyun Ahn, Tsung Sheng Kang, Junhao Zhu, Fan Ren, Stephen J. Pearton, David Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Recovery in dc performance of off-state step-stressed AlGaN/GaN high electron mobility transistor with thermal annealing'. Together they form a unique fingerprint.

Engineering & Materials Science