Abstract
Rapid firing processes are well known to allow improvements in solar cell contacts, particularly for the rear contact. Previous results characterizing the quality of a rear aluminum-alloyed back surface field have measured the effective surface recombination velocity, which depends not only on the material parameters of the back surface field, but also on the base doping. This paper shows that the determination of the recombination current density in the back surface field via photoconductance measurements is an accurate technique to measure the back surface field, independent of the base resistivity. Results show that fast firing conditions give the lowest recombination, but that the firing conditions can be altered substantially while still allowing high open circuit voltages.
Original language | English (US) |
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Title of host publication | Conference Record of the IEEE Photovoltaic Specialists Conference |
Pages | 410-413 |
Number of pages | 4 |
State | Published - 2002 |
Externally published | Yes |
Event | 29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States Duration: May 19 2002 → May 24 2002 |
Other
Other | 29th IEEE Photovoltaic Specialists Conference |
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Country/Territory | United States |
City | New Orleans, LA |
Period | 5/19/02 → 5/24/02 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Condensed Matter Physics