@inproceedings{95a779fdc77240e484d7588fcf9f3511,
title = "Radiation tolerant MESFET-CMOS low dropout linear regulator for integrated power management at the 45nm node",
abstract = "A low dropout linear regulator comprising a MESFET pass transistor with an integrated CMOS error amplifier has been fabricated using a commercial 45nm SOI foundry. Good regulation is observed after irradiation to 1 Mrad(Si).",
author = "Trevor Thornton and William Lepkowski and Wilk, {Seth J.} and Michael Goryll and Bo Chen and Jason Kam and Bertan Bakkaloglu and Keith Holbert",
year = "2013",
month = dec,
day = "1",
doi = "10.1109/REDW.2013.6658204",
language = "English (US)",
isbn = "9781479911363",
series = "IEEE Radiation Effects Data Workshop",
booktitle = "2013 IEEE Radiation Effects Data Workshop, REDW 2013 - Held in Conjunction with the IEEE Nuclear and Space Radiation Effects Conference, NSREC 2013",
note = "2013 IEEE Radiation Effects Data Workshop, REDW 2013 - Held in Conjunction with the 50th IEEE Nuclear and Space Radiation Effects Conference, NSREC 2013 ; Conference date: 08-07-2013 Through 12-07-2013",
}