Radiation effects studies on thin film TiO2 memristor devices

Erica Deionno, Mark D. Looper, Jon V. Osborn, Hugh Barnaby, William M. Tong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

20 Scopus citations


Memristor devices have been identified as potential replacements for a variety of memory applications and may also be suitable for space applications. In this work, we present a review of radiation testing on TiO2-based memristor devices. The experimental results from three previous studies are reviewed and coupled here with modeling to gain a more complete understanding of the energy deposition and resulting effects on the electrical performance of the device. In addition, we discuss the implications of having a nanometer scaled thin film device and how that affects the energy deposition from the various radiation sources.

Original languageEnglish (US)
Title of host publication2013 IEEE Aerospace Conference, AERO 2013
StatePublished - 2013
Event2013 IEEE Aerospace Conference, AERO 2013 - Big Sky, MT, United States
Duration: Mar 2 2013Mar 9 2013

Publication series

NameIEEE Aerospace Conference Proceedings
ISSN (Print)1095-323X


Other2013 IEEE Aerospace Conference, AERO 2013
Country/TerritoryUnited States
CityBig Sky, MT

ASJC Scopus subject areas

  • Aerospace Engineering
  • Space and Planetary Science


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