TY - JOUR
T1 - Quantitative electron microdiffraction
AU - Spence, John
N1 - Funding Information:
Acknowledgments. This work was supported by NSF award DMR-9412146 and collaborators cited In references, especially Drs. Zuo. Hoier. O'Keeffe and Holmstad.
PY - 1996
Y1 - 1996
N2 - The uses and significance of the ground state charge density distribution in crystals are reviewed. Methods for measuring this quantity quantitative transmission electron microdiffraction are discussed, based on accurate measurement of structure factor amplitudes and phases. It is demonstrated that the effect of 5at% doping on convergent beam electron diffraction (CBED) intensities is easily measured, and the effect of doping by Mn at this level on gamma TiAl is studied and the implications for mechanical properties are discussed. The significance of the mean electrostatic potential is reviewed in terms of surface effects and bulk bonding. Phase determination using overlapping coherent CBED orders is reviewed, the deleterious effects of multiple scattering are emphasised, and the symmetry properties of the resulting patterns are analysed.
AB - The uses and significance of the ground state charge density distribution in crystals are reviewed. Methods for measuring this quantity quantitative transmission electron microdiffraction are discussed, based on accurate measurement of structure factor amplitudes and phases. It is demonstrated that the effect of 5at% doping on convergent beam electron diffraction (CBED) intensities is easily measured, and the effect of doping by Mn at this level on gamma TiAl is studied and the implications for mechanical properties are discussed. The significance of the mean electrostatic potential is reviewed in terms of surface effects and bulk bonding. Phase determination using overlapping coherent CBED orders is reviewed, the deleterious effects of multiple scattering are emphasised, and the symmetry properties of the resulting patterns are analysed.
KW - Charge density
KW - Electron diffraction
KW - Microdiffraction
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U2 - 10.1093/oxfordjournals.jmicro.a023407
DO - 10.1093/oxfordjournals.jmicro.a023407
M3 - Article
AN - SCOPUS:4243061894
SN - 0022-0744
VL - 45
SP - 19
EP - 26
JO - Journal of Electron Microscopy
JF - Journal of Electron Microscopy
IS - 1
ER -