Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography

M. R. Johnson, D. A. Cullen, David Smith, L. Zhou, Martha McCartney

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1832-1833
Number of pages2
JournalMicroscopy and Microanalysis
StatePublished - 2012

ASJC Scopus subject areas

  • Instrumentation

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