Probing exciton localization in single-walled carbon nanotubes using high-resolution near-field microscopy

Carsten Georgi, Alexander A. Green, Mark C. Hersam, Achim Hartschuh

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

We observe localization of excitons in semiconducting single-walled carbon nanotubes at room temperature using high-resolution near-field photoluminescence (PL) microscopy. Localization is the result of spatially confined exciton energy minima with depths of more than 15 meV connected to lateral energy gradients exceeding 2 meV/nm as evidenced by energy-resolved PL imaging. Simulations of exciton diffusion in the presence of energy variations support this interpretation predicting strongly enhanced PL at local energy minima.

Original languageEnglish (US)
Pages (from-to)5914-5920
Number of pages7
JournalACS nano
Volume4
Issue number10
DOIs
StatePublished - Oct 26 2010
Externally publishedYes

Keywords

  • excitons
  • localization
  • near-field microscopy
  • photoluminescence
  • single-walled carbon nanotubes

ASJC Scopus subject areas

  • General Materials Science
  • General Engineering
  • General Physics and Astronomy

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