TY - JOUR
T1 - P-i-N and Schottky P-i-N diamond diodes for high power limiters
AU - Surdi, Harshad
AU - Bressler, Mason
AU - Ahmad, Mohammad Faizan
AU - Koeck, Franz
AU - Winters, Bryce
AU - Goodnick, Stephen
AU - Thornton, Trevor
AU - Nemanich, Robert J.
AU - Chang, Josephine
N1 - Publisher Copyright:
© 2024 Author(s).
PY - 2024/2/5
Y1 - 2024/2/5
N2 - P-i-N and Schottky P-i-N diamond diodes are a promising technology for high-power limiters. Receivers, solid-state amplifiers, and detectors commonly use P-i-N and/or Schottky diodes for protection from high power incident signals. Here, we report on the RF power handling and power dissipation capability of diamond P-i-N and Schottky P-i-N diodes. We fabricate P-i-N diodes as vertical structures, with both majority and minority carriers involved in charge transport. Similarly, we fabricate vertical Schottky P-i-N diodes, with the doping in the n-layer reduced compared to P-i-N diodes such that the n-layer becomes fully depleted during operation, resulting in a majority-carrier device with a fast recovery time. Both P-i-N and Schottky P-i-N diodes were packaged in shunt-configuration and matched for 3 GHz operation, with a small signal insertion loss of ∼1.25 dB. P-i-N diodes operated up to 40 dBm before failing nondestructively at 45 dBm, demonstrating power dissipation handling that exceeds that of commercially available Si P-i-N diodes by more than a factor of five. Schottky P-i-N diodes operated up to 49 dBm before non-recoverable failure at 50 dBm.
AB - P-i-N and Schottky P-i-N diamond diodes are a promising technology for high-power limiters. Receivers, solid-state amplifiers, and detectors commonly use P-i-N and/or Schottky diodes for protection from high power incident signals. Here, we report on the RF power handling and power dissipation capability of diamond P-i-N and Schottky P-i-N diodes. We fabricate P-i-N diodes as vertical structures, with both majority and minority carriers involved in charge transport. Similarly, we fabricate vertical Schottky P-i-N diodes, with the doping in the n-layer reduced compared to P-i-N diodes such that the n-layer becomes fully depleted during operation, resulting in a majority-carrier device with a fast recovery time. Both P-i-N and Schottky P-i-N diodes were packaged in shunt-configuration and matched for 3 GHz operation, with a small signal insertion loss of ∼1.25 dB. P-i-N diodes operated up to 40 dBm before failing nondestructively at 45 dBm, demonstrating power dissipation handling that exceeds that of commercially available Si P-i-N diodes by more than a factor of five. Schottky P-i-N diodes operated up to 49 dBm before non-recoverable failure at 50 dBm.
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U2 - 10.1063/5.0176966
DO - 10.1063/5.0176966
M3 - Article
AN - SCOPUS:85184993478
SN - 0003-6951
VL - 124
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 6
M1 - 062104
ER -