Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells

Laura Ding; Stephen P. Harvey; Glenn Teeter; Mariana Bertoni

doi:10.1109/PVSC.2016.7750330

Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells

Laura Ding, Stephen P. Harvey, Glenn Teeter, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier-selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

Original language	English (US)
Title of host publication	2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	3543-3546
Number of pages	4
Volume	2016-November
ISBN (Electronic)	9781509027248
DOIs	https://doi.org/10.1109/PVSC.2016.7750330
State	Published - Nov 18 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: Jun 5 2016 → Jun 10 2016

Other

Other	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	6/5/16 → 6/10/16

Keywords

carrier-selective contact
operando
silicon solar cell
x-ray photoelectron spectroscopy

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2016.7750330

Cite this

Ding, L., Harvey, S. P., Teeter, G., & Bertoni, M. (2016). Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 (Vol. 2016-November, pp. 3543-3546). Article 7750330 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2016.7750330

Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells. / Ding, Laura; Harvey, Stephen P.; Teeter, Glenn et al.
2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Vol. 2016-November Institute of Electrical and Electronics Engineers Inc., 2016. p. 3543-3546 7750330.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ding, L, Harvey, SP, Teeter, G & Bertoni, M 2016, Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells. in 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. vol. 2016-November, 7750330, Institute of Electrical and Electronics Engineers Inc., pp. 3543-3546, 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 6/5/16. https://doi.org/10.1109/PVSC.2016.7750330

Ding L, Harvey SP, Teeter G, Bertoni M. Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Vol. 2016-November. Institute of Electrical and Electronics Engineers Inc. 2016. p. 3543-3546. 7750330 doi: 10.1109/PVSC.2016.7750330

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Operando XPS characterization of selective contacts: The case of molybdenum oxide for crystalline silicon heterojunction solar cells

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