On the source of silicon minority-carrier lifetime degradation during molecular beam heteroepitaxial growth of III-V materials

Laura Ding, Chaomin Zhang, Tine Uberg Norland, Nikolai Faleev, Christiana Honsberg, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

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Engineering & Materials Science