Abstract
On-chip interconnect must be accounted for at all levels of the design hierarchy, starting with synthesis, through physical design and ending with verification. Developing a compact model for an interconnect is important to render consistent interconnect models at different levels of the design hierarchy and achieve design convergence. This development requires on-chip modeling technologies for post-layout verification, called `parasitic extraction', and characterization/silicon-correlation which is important to interconnect modeling at all levels.
Original language | English (US) |
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Number of pages | 1 |
State | Published - Dec 1 1997 |
Event | Proceedings of the 1997 6th Topical Meeting on Electrical Performance of Electronic Packaging - San Jose, CA, USA Duration: Oct 27 1997 → Oct 29 1997 |
Other
Other | Proceedings of the 1997 6th Topical Meeting on Electrical Performance of Electronic Packaging |
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City | San Jose, CA, USA |
Period | 10/27/97 → 10/29/97 |
ASJC Scopus subject areas
- Engineering(all)