A method for observing thickness extinction contours with a point projection electron microscope is outlined which offers several advantages over normal methods using the conventional transmission electron microscope.
|Original language||English (US)|
|Number of pages||4|
|State||Published - Jan 1 1977|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering