Abstract
The dependence of the band gap (E G) and higher critical-point energies of dilute-nitrogen Ga 1-yIn yAs 1-xN x epilayers on nitrogen mole fraction (x) was investigated using photoreflectance spectroscopy. It was found that band gap decreases with increasing x in a highly nonlinear fashion. It was observed that as x increases, the bowing parameter become less negative. Results suggest that nitrogen-related impurity levels arise within the band gap of dilute-nitrogen GaInAsN alloys.
Original language | English (US) |
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Pages (from-to) | 7576-7580 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 94 |
Issue number | 12 |
DOIs | |
State | Published - Dec 15 2003 |
ASJC Scopus subject areas
- Physics and Astronomy(all)