Nanoscale structural and magnetic characterization using electron microscopy

David Smith, Martha McCartney, Rafal E. Dunin-Borkowski

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Scopus citations


The transmission electron microscope (TEM) is a powerful instrument for structural, chemical and magnetic characterization at the nanoscale. Imaging, diffraction and microanalytical information can be combined with complementary micromagnetic information to provide a more thorough understanding of magnetic behavior. The first part of this chapter provides a brief overview of TEM operating modes that are suitable for examination of magnetic materials. The latter part provides examples that serve to illustrate the diverse range of materials that can be usefully studied.

Original languageEnglish (US)
Title of host publicationAdvanced Magnetic Nanostructures
PublisherSpringer US
Number of pages27
ISBN (Print)0387233091, 9780387233093
StatePublished - Dec 1 2006

ASJC Scopus subject areas

  • General Physics and Astronomy


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