Fingerprint
Dive into the research topics of 'Modeling of dynamic threshold voltage of high K gate stack and application in FinFET reliability simulation'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Yun Ye, Hongyu He, Chenyue Ma, Cheng Wang, Aixi Zhang, Jin He, Yu Cao
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution