Abstract
The tip of a scanning probe microscope was used to detach nanometer-scale, single crystal NaCl particles grown on soda lime glass substrates. After imaging a particle at low contact forces, a single line scan at high contact force was used to detach the particle from the substrate. The peak lateral force at detachment is a strong function of particle contact area and humidity. As the relative humidity is raised from low to high values, the strength of the particle-substrate bond decreases dramatically. We interpret these results in terms of detachment by chemically-assisted crack growth along the NaCl-glass interface. Numerical estimates of the electrostatic and dispersive contributions to the work of adhesion are also discussed.
Original language | English (US) |
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Pages (from-to) | 373-390 |
Number of pages | 18 |
Journal | Journal of Adhesion |
Volume | 74 |
Issue number | 1-4 |
DOIs | |
State | Published - 2000 |
Externally published | Yes |
Keywords
- Crack growth, chemically assisted
- Humidity effects
- Particle removal
- Scanning force microscopy
- Work of adhesion Model
ASJC Scopus subject areas
- General Chemistry
- Mechanics of Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry