Measurements of transmitted electron beam extinction through Si crystal membranes

E. A. Nanni, R. K. Li, C. Limborg, X. Shen, S. Weathersby, William Graves, Richard Kirian, John Spence, Uwe Weierstall

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

A recently proposed method for the generation of relativistic electron beams with nanometer-scale current modulation requires diffracting relativistic electrons from a perfect crystal Si grating, accelerating the diffracted beam and imaging the crystal structure into the temporal dimension via emittance exchange. The relative intensity of the current modulation is limited by the ability to extinguish the transmitted beam via diffraction with a single-crystal Si membrane. In these preliminary experiments we will measure the extinction of the transmitted electron beam at zero scattering angle due to multiple Bragg scattering from a Si membrane with a uniform thickness of 340 nm at 2.35 MeV using the SLAC UED facility. The impact of beam divergence and charge density at the Si target will be quantified. The longevity of the Si membrane will also be investigated by monitoring the diffraction pattern as a function of time to observe the potential onset of damage to the crystal.

Original languageEnglish (US)
Title of host publicationIPAC 2016 - Proceedings of the 7th International Particle Accelerator Conference
PublisherJoint Accelerator Conferences Website (JACoW)
Pages1611-1614
Number of pages4
ISBN (Electronic)9783954501472
StatePublished - 2016
Event7th International Particle Accelerator Conference, IPAC 2016 - Busan, Korea, Republic of
Duration: May 8 2016May 13 2016

Publication series

NameIPAC 2016 - Proceedings of the 7th International Particle Accelerator Conference

Other

Other7th International Particle Accelerator Conference, IPAC 2016
Country/TerritoryKorea, Republic of
CityBusan
Period5/8/165/13/16

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Atomic and Molecular Physics, and Optics

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