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Dive into the research topics of 'Measurement of the Germanium fraction in strained and relaxed SiGe by Spectroscopic Ellipsometry'. Together they form a unique fingerprint.- Sort by
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J. Moers, D. M. Buca, M. Goryll, R. Loo, M. Caymax, S. Mantl
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution