Measurement of individual structure‐factor phases with tenth‐degree accuracy: the 00.2 reflection in BeO studied by electron and X‐ray diffraction

J. M. Zuo, John Spence, J. Downs, J. Mayer

Research output: Contribution to journalArticlepeer-review

19 Scopus citations
Original languageEnglish (US)
Pages (from-to)422-429
Number of pages8
JournalActa Crystallographica Section A
Issue number3
StatePublished - May 1993

ASJC Scopus subject areas

  • Structural Biology

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