Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography

Zhaofeng Gan, Daniel E. Smith, Martha McCartney, D. E. Perea, S. T. Picraux

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1826-1827
Number of pages2
JournalMicroscopy and Microanalysis
StatePublished - Jul 2012

ASJC Scopus subject areas

  • Instrumentation

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