TY - GEN
T1 - Mapping Current Collection in Cross Section
T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
AU - Kumar, Niranjana Mohan
AU - Shaik, Abdul R.
AU - Walker, Trumann
AU - Nietzold, Tara
AU - Lai, Barry
AU - Colegrove, Eric
AU - Stuckelberger, Michael
AU - Bertoni, Mariana
N1 - Funding Information:
This material is based on the work supported by the Department of Energy under contracts DE-EE-0008163 and DE-EE-0008754.
Publisher Copyright:
© 2020 IEEE.
PY - 2020/6/14
Y1 - 2020/6/14
N2 - For decades, copper has been used to improve the performance of cadmium telluride thin film solar cells. However, it has also been shown to be the main cause of metastability in CdTe. Recently a low activation energy has been reported for the thermal diffusion of Cu in CdTe explaining the ease of motion that it has under moderate temperatures. The community consensus is that copper segregates to the absorber grain boundaries, where it's either beneficial or detrimental to device performance depending on its concentration. Using nanoscale X-ray micrsocopy and a two-dimensional drift-diffusion model we present a preliminary correlation between local copper distribution and electrical performance of a single-junction CdTe/CdS solar cell.
AB - For decades, copper has been used to improve the performance of cadmium telluride thin film solar cells. However, it has also been shown to be the main cause of metastability in CdTe. Recently a low activation energy has been reported for the thermal diffusion of Cu in CdTe explaining the ease of motion that it has under moderate temperatures. The community consensus is that copper segregates to the absorber grain boundaries, where it's either beneficial or detrimental to device performance depending on its concentration. Using nanoscale X-ray micrsocopy and a two-dimensional drift-diffusion model we present a preliminary correlation between local copper distribution and electrical performance of a single-junction CdTe/CdS solar cell.
KW - CdTe
KW - X-ray beam induced current
KW - drift-diffusion modeling
UR - http://www.scopus.com/inward/record.url?scp=85099560120&partnerID=8YFLogxK
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U2 - 10.1109/PVSC45281.2020.9300979
DO - 10.1109/PVSC45281.2020.9300979
M3 - Conference contribution
AN - SCOPUS:85099560120
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 2178
EP - 2180
BT - 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 15 June 2020 through 21 August 2020
ER -