Magnetic force microscope utilizing an ultra-small-spring-constant vertically cantilevered tip

A. DiCarlo, M. R. Scheinfein, Ralph Chamberlin

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


We have developed a novel vertical cantilever geometry for scanning force microscopy. The vertical cantilever has several advantages over horizontal cantilever designs. The vertical cantilever is sensitive to vertical forces and horizontal force gradients; its lateral response is inherently directional; and the vertical geometry inhibits uncontrolled vertical deflections, thereby reducing the incidence of tip crashes and facilitating the use of ultra-small-spring-constant cantilevers for superior force sensitivity. We have constructed a magnetic force microscope (MFM) utilizing the vertical cantilever geometry. Images of magnetic recording media are used to illustrate the capabilities of our MFM.

Original languageEnglish (US)
Pages (from-to)383-392
Number of pages10
Issue number4
StatePublished - Dec 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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