Low energy point reflection electron microscopy

John Spence, X. Zhang, Uwe Weierstall, J. M. Zuo, E. Munro, J. Rouse

Research output: Contribution to journalArticlepeer-review

7 Scopus citations
Original languageEnglish (US)
Pages (from-to)577-587
Number of pages11
JournalSurface Review and Letters
Issue number3
StatePublished - Jun 1997

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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