Abstract
We demonstrate the application of a commercially available slow-scan CCD camera to low-dose high-resolution electron microscopy on zeolite materials. A resolution of 2 [Aring] has been successfully achieved for both Y-zeolite and ZSM-5. The slow-scan CCD camera offers two important advantages: (1) low readout noise which allows high-resolution images to be recorded with very low beam intensity; (2) digital storage of the CCD images which allows immediate evaluation of recorded image quality using on-line image-processing routines, making the image recording much more efficient. Image processing is essential for retrieving the high-resolution structure information that is often obscured by the noise in a low-dose image.
Original language | English (US) |
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Pages (from-to) | 332-340 |
Number of pages | 9 |
Journal | Ultramicroscopy |
Volume | 48 |
Issue number | 3 |
DOIs | |
State | Published - Mar 1993 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation