Low-dose aberration corrected cryo-electron microscopy of organic specimens

James E. Evans, Crispin Hetherington, Angus Kirkland, Lan Yun Chang, Henning Stahlberg, Nigel Browning

Research output: Contribution to journalArticlepeer-review

38 Scopus citations


Spherical aberration (Cs) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions Cs-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

Original languageEnglish (US)
Pages (from-to)1636-1644
Number of pages9
Issue number12
StatePublished - Nov 2008
Externally publishedYes


  • Aberration correction
  • Cryo-EM
  • Electron microscopy
  • TEM

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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