Abstract
Silicon film with pre-crack was used to study the coupling effect of stress and electrochemical field around the crack tip. The in-situ experiments were established to monitor the crack to realize the stress concentration around the crack and simultaneously prevent the crack initiation. The ex-situ Auger electron spectroscopy experiments shown the remarkably Li redistributed phenomenon around the crack tip. Furthermore, the fully coupled finite element method was used to reveal the fundamental mechanisms of the Li gathering effect and the stress relaxation phenomenon around the crack tip.
Original language | English (US) |
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Pages (from-to) | 11-15 |
Number of pages | 5 |
Journal | Scripta Materialia |
Volume | 167 |
DOIs | |
State | Published - Jul 1 2019 |
Keywords
- Crack tip
- Electrochemistry
- Lithium-ion batteries
- Silicon
- Stress-assisted diffusion
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys