Large-scale broad-band parasitic extraction for fast layout verification of 3-D RF and mixed-signal on-chip structures

Feng Ling, Vladimir I. Okhmatovski, Warren Harris, Stephen McCracken, Aykut Dengi

Research output: Contribution to journalArticlepeer-review

46 Scopus citations


In this paper, a methodology for efficient parasitic extraction and verification flow for RF and mixed-signal integrated-circuit designs is presented. The implementation of a multiplane precorrected fast Fourier transform (PFFT) computational engine enables the full-wave electromagnetic (EM) simulation of interconnects and passive components. The PFFT algorithm is implemented on a set of two-dimensional fast Fourier transform grids associated with the current sheets corresponding to the conductor loss models. This leads to the full-wave modeling of silicon embedded three-dimensional circuits within the two-and-one-half-dimensional computational framework yielding the O(N log N) computational complexity and O(N) memory requirements of the algorithm. The broad-band capability of the EM solver is provided through the loop-tree/charge implementation of the PFFT algorithm allowing for robust full-wave modeling from dc to microwaves. The EM verification flow is integrated seamlessly within the Cadence environment allowing for non-linear circuit simulation of the entire device. The capability and accuracy of the proposed methodology is demonstrated through EM simulation results for an individual on-chip spiral inductor, as well as a low-noise amplifier.

Original languageEnglish (US)
Pages (from-to)264-272
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Issue number1
StatePublished - Jan 2005
Externally publishedYes


  • Electromagnetic (EM) solver
  • Fast algorithm
  • Method of moments (MoM)
  • Multiplane precorrected fast fourier transform (PFFT)
  • Parasitic extraction
  • Rf integrated circuit (RFIC)
  • Spiral inductor

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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