TY - JOUR
T1 - Inversion of Many-Beam Bragg Intensities for Phasing by Iterated Projections
T2 - Removal of Multiple Scattering Artifacts from Diffraction Data
AU - Donatelli, Jeffrey J.
AU - Spence, John C.H.
N1 - Funding Information:
This work was funded by the Advanced Scientific Computing Research and Basic Energy Sciences programs of the Office of Science of Department of Energy (DOE) (Award No. DE-AC02-05CH11231), by Laboratory Directed Research and Development funds from Berkeley Lab from the Director, Office of Science DOE (Award No. DE-AC02-05CH11231), and by NSF BioXFEL STC Grant No. 1231306.
Publisher Copyright:
© 2020 American Physical Society.
PY - 2020/8/7
Y1 - 2020/8/7
N2 - An iterated projection algorithm (N-Phaser) is developed that reconstructs a scattering potential from N-beam multiple Bragg scattered intensities. The method may be used to eliminate multiple scattering artifacts from electron diffraction data, solving the phase problem and increasing the thicknesses of samples used in materials science, solid-state chemistry, and small molecule crystallography. For high-energy transmission electron diffraction, we show that the algorithm recovers accurate complex structure factors from a wide range of thicknesses, orientations, and relativistic beam energies, and does not require known thickness or atomic-resolution data if sufficient multiple scattering occurs. Extensions to Cryo-electron microscopy and Micro-electron diffraction are suggested.
AB - An iterated projection algorithm (N-Phaser) is developed that reconstructs a scattering potential from N-beam multiple Bragg scattered intensities. The method may be used to eliminate multiple scattering artifacts from electron diffraction data, solving the phase problem and increasing the thicknesses of samples used in materials science, solid-state chemistry, and small molecule crystallography. For high-energy transmission electron diffraction, we show that the algorithm recovers accurate complex structure factors from a wide range of thicknesses, orientations, and relativistic beam energies, and does not require known thickness or atomic-resolution data if sufficient multiple scattering occurs. Extensions to Cryo-electron microscopy and Micro-electron diffraction are suggested.
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U2 - 10.1103/PhysRevLett.125.065502
DO - 10.1103/PhysRevLett.125.065502
M3 - Article
C2 - 32845656
AN - SCOPUS:85089960164
SN - 0031-9007
VL - 125
JO - Physical Review Letters
JF - Physical Review Letters
IS - 6
M1 - 065502
ER -