Ricardo Reis, Yu Cao, Gilson Wirth

Research output: Chapter in Book/Report/Conference proceedingChapter


The scaling of CMOS technology to the nanometer regime inevitability increases reliability concerns, profoundly impacting all aspects of circuit performance and posing a fundamental challenge to future IC design. These reliability concerns arise from many different sources, and become more severe with continuous scaling.

Original languageEnglish (US)
Title of host publicationCircuit Design for Reliability
PublisherSpringer New York
Number of pages4
ISBN (Electronic)9781461440789
ISBN (Print)9781461440772
StatePublished - Jan 1 2015

ASJC Scopus subject areas

  • Engineering(all)


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