INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST OF PAPERS, PASADENA, CALIF, MAR 1-3 1971.

George C. Gilley; L. W. Bearnson; C. C. Carroll; W. G. Bouricius; E. P. Hsieh; G. R. Putzolu; J. P. Roth; P. R. Schneider; C. J. Tan; M. Y. Hsiao; D. K. Chia; S. S. Yau; Y. S. Tang; M. A. Breuer; J. F. Meyer

INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST OF PAPERS, PASADENA, CALIF, MAR 1-3 1971.

George C. Gilley, L. W. Bearnson, C. C. Carroll, W. G. Bouricius, E. P. Hsieh, G. R. Putzolu, J. P. Roth, P. R. Schneider, C. J. Tan, M. Y. Hsiao, D. K. Chia, S. S. Yau, Y. S. Tang, M. A. Breuer, J. F. Meyer

Research output: Contribution to conference › Paper › peer-review

Abstract

Collection of 37 papers by various authors. The topics discussed are; tests generation and diagnosis, fault-location and testing, diagnosis and testing, reliability modeling and analysis, architecture and design, error protection and recovery, and software reliability. Following is a list of the titles and authors. On the Design of Minimum Length Fault Tests for Combinational Circuits. By L. W. Bearnson and C. C. Carroll. Algorithms for Detection of Faults in Logic Circuits. By W. G. Bouricius, E. P. Hsieh, G. R. Putzolu, J. P. Roth, P. R. Schneider and C. J. Tan. Boolean Difference for Fault-Detection in Asynchronous Sequential Machines. By M. Y. Hsiao and D. K. Chia. Efficient Algorithm for Generating Complete Test Sets for Combinational Logic Circuits. By S. S. Yau and Y. S Tang. Generation of Fault Detection Tests for Sequential Circuits. By M. A. Breuer. Diagnosable Machine Realizations of Sequential Behavior. By J. F. Meyer and K. Yeh.

Original language	English (US)
State	Published - 1971
Externally published	Yes

ASJC Scopus subject areas

Engineering(all)

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@conference{4cd1502708c8400999469e7a30e3c5bf,

title = "INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST OF PAPERS, PASADENA, CALIF, MAR 1-3 1971.",

abstract = "Collection of 37 papers by various authors. The topics discussed are; tests generation and diagnosis, fault-location and testing, diagnosis and testing, reliability modeling and analysis, architecture and design, error protection and recovery, and software reliability. Following is a list of the titles and authors. On the Design of Minimum Length Fault Tests for Combinational Circuits. By L. W. Bearnson and C. C. Carroll. Algorithms for Detection of Faults in Logic Circuits. By W. G. Bouricius, E. P. Hsieh, G. R. Putzolu, J. P. Roth, P. R. Schneider and C. J. Tan. Boolean Difference for Fault-Detection in Asynchronous Sequential Machines. By M. Y. Hsiao and D. K. Chia. Efficient Algorithm for Generating Complete Test Sets for Combinational Logic Circuits. By S. S. Yau and Y. S Tang. Generation of Fault Detection Tests for Sequential Circuits. By M. A. Breuer. Diagnosable Machine Realizations of Sequential Behavior. By J. F. Meyer and K. Yeh.",

author = "Gilley, {George C.} and Bearnson, {L. W.} and Carroll, {C. C.} and Bouricius, {W. G.} and Hsieh, {E. P.} and Putzolu, {G. R.} and Roth, {J. P.} and Schneider, {P. R.} and Tan, {C. J.} and Hsiao, {M. Y.} and Chia, {D. K.} and Yau, {S. S.} and Tang, {Y. S.} and Breuer, {M. A.} and Meyer, {J. F.}",

year = "1971",

language = "English (US)",

}

TY - CONF

T1 - INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST OF PAPERS, PASADENA, CALIF, MAR 1-3 1971.

AU - Gilley, George C.

AU - Bearnson, L. W.

AU - Carroll, C. C.

AU - Bouricius, W. G.

AU - Hsieh, E. P.

AU - Putzolu, G. R.

AU - Roth, J. P.

AU - Schneider, P. R.

AU - Tan, C. J.

AU - Hsiao, M. Y.

AU - Chia, D. K.

AU - Yau, S. S.

AU - Tang, Y. S.

AU - Breuer, M. A.

AU - Meyer, J. F.

PY - 1971

Y1 - 1971

N2 - Collection of 37 papers by various authors. The topics discussed are; tests generation and diagnosis, fault-location and testing, diagnosis and testing, reliability modeling and analysis, architecture and design, error protection and recovery, and software reliability. Following is a list of the titles and authors. On the Design of Minimum Length Fault Tests for Combinational Circuits. By L. W. Bearnson and C. C. Carroll. Algorithms for Detection of Faults in Logic Circuits. By W. G. Bouricius, E. P. Hsieh, G. R. Putzolu, J. P. Roth, P. R. Schneider and C. J. Tan. Boolean Difference for Fault-Detection in Asynchronous Sequential Machines. By M. Y. Hsiao and D. K. Chia. Efficient Algorithm for Generating Complete Test Sets for Combinational Logic Circuits. By S. S. Yau and Y. S Tang. Generation of Fault Detection Tests for Sequential Circuits. By M. A. Breuer. Diagnosable Machine Realizations of Sequential Behavior. By J. F. Meyer and K. Yeh.

AB - Collection of 37 papers by various authors. The topics discussed are; tests generation and diagnosis, fault-location and testing, diagnosis and testing, reliability modeling and analysis, architecture and design, error protection and recovery, and software reliability. Following is a list of the titles and authors. On the Design of Minimum Length Fault Tests for Combinational Circuits. By L. W. Bearnson and C. C. Carroll. Algorithms for Detection of Faults in Logic Circuits. By W. G. Bouricius, E. P. Hsieh, G. R. Putzolu, J. P. Roth, P. R. Schneider and C. J. Tan. Boolean Difference for Fault-Detection in Asynchronous Sequential Machines. By M. Y. Hsiao and D. K. Chia. Efficient Algorithm for Generating Complete Test Sets for Combinational Logic Circuits. By S. S. Yau and Y. S Tang. Generation of Fault Detection Tests for Sequential Circuits. By M. A. Breuer. Diagnosable Machine Realizations of Sequential Behavior. By J. F. Meyer and K. Yeh.

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UR - http://www.scopus.com/inward/citedby.url?scp=85100360832&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:85100360832

ER -

INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST OF PAPERS, PASADENA, CALIF, MAR 1-3 1971.

Abstract

ASJC Scopus subject areas

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