Integrated circuit identification and true random numbers using 1.5-transistor flash memory

Lawrence T. Clark; James Adams; Keith Holbert

doi:10.1109/ISQED.2017.7918323

Integrated circuit identification and true random numbers using 1.5-transistor flash memory

Lawrence T. Clark, James Adams, Keith Holbert

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Flash memory bits, like other integrated circuit (IC) devices, are prone to random variability in their actual vs. nominal characteristics. We present the use of 1.5-T flash memory cells in physically unclonable functions (PUFs) leveraging their erase speed variability. This type of memory is interesting for the internet of things (IOT) due to its wide availability as IP at foundries. Using experimentally measured results, we show simple methods that provide high reliability with no or limited need for helper data and error correction. High quality fingerprints for IC identification are demonstrated. Moreover, techniques to remove systematic variations from the array response are shown, allowing the resulting binary strings to pass all National Institute of Standards and Technology tests for randomness. Consequently, with low complexity helper functions, true random numbers can be readily produced.

Original language	English (US)
Title of host publication	Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017
Publisher	IEEE Computer Society
Pages	244-249
Number of pages	6
ISBN (Electronic)	9781509054046
DOIs	https://doi.org/10.1109/ISQED.2017.7918323
State	Published - May 2 2017
Event	18th International Symposium on Quality Electronic Design, ISQED 2017 - Santa Clara, United States Duration: Mar 14 2017 → Mar 15 2017

Other

Other	18th International Symposium on Quality Electronic Design, ISQED 2017
Country/Territory	United States
City	Santa Clara
Period	3/14/17 → 3/15/17

Keywords

flash memory
physically unclonable functions
systematic mismatch
True random number generation

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality

Access to Document

10.1109/ISQED.2017.7918323

Cite this

Integrated circuit identification and true random numbers using 1.5-transistor flash memory. / Clark, Lawrence T.; Adams, James; Holbert, Keith.
Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017. IEEE Computer Society, 2017. p. 244-249 7918323.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Clark, LT, Adams, J & Holbert, K 2017, Integrated circuit identification and true random numbers using 1.5-transistor flash memory. in Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017., 7918323, IEEE Computer Society, pp. 244-249, 18th International Symposium on Quality Electronic Design, ISQED 2017, Santa Clara, United States, 3/14/17. https://doi.org/10.1109/ISQED.2017.7918323

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Integrated circuit identification and true random numbers using 1.5-transistor flash memory

Abstract

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Keywords

ASJC Scopus subject areas

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