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Impact Ionization and Interface Trap Generation in 28-nm MOSFETs at Cryogenic Temperatures
Xiaodong Yan, H. Wang, Hugh Barnaby, I. S. Esqueda
- Applied Nanoionics, Center for (CANi)
- Embedded Systems, Consortium for (CES)
- Solid State Electronics Research Center (CSSER)
- Electrical Engineering
- Connection One (C1)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Adaptive Neural Systems, Center for (ANS)
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations