Imaging of GaAs nanowire using combined aberration-corrected TEM/STEM and exit wave restoration

L. Y. Chang; S. Lazar; B. B́rtov́; G. Botton; C. H́bert; A. Fontcuberta I. Morral

doi:10.1017/S1431927609096470

Imaging of GaAs nanowire using combined aberration-corrected TEM/STEM and exit wave restoration

L. Y. Chang, S. Lazar, B. B́rtov́, G. Botton, C. H́bert, A. Fontcuberta I. Morral

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	138-139
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609096470
State	Published - Jul 2009
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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title = "Imaging of GaAs nanowire using combined aberration-corrected TEM/STEM and exit wave restoration",

author = "Chang, {L. Y.} and S. Lazar and B. {\'B}rto{\'v} and G. Botton and C. {\'H}bert and Morral, {A. Fontcuberta I.}",

year = "2009",

month = jul,

doi = "10.1017/S1431927609096470",

language = "English (US)",

volume = "15",

pages = "138--139",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

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TY - JOUR

T1 - Imaging of GaAs nanowire using combined aberration-corrected TEM/STEM and exit wave restoration

AU - Chang, L. Y.

AU - Lazar, S.

AU - B́rtov́, B.

AU - Botton, G.

AU - H́bert, C.

AU - Morral, A. Fontcuberta I.

PY - 2009/7

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U2 - 10.1017/S1431927609096470

DO - 10.1017/S1431927609096470

M3 - Article

AN - SCOPUS:69949169288

SN - 1431-9276

VL - 15

SP - 138

EP - 139

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Imaging of GaAs nanowire using combined aberration-corrected TEM/STEM and exit wave restoration

ASJC Scopus subject areas

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