Imaging of GaAs nanowire using combined aberration-corrected TEM/STEM and exit wave restoration

L. Y. Chang, S. Lazar, B. B́rtov́, G. Botton, C. H́bert, A. Fontcuberta I. Morral

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)138-139
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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