Abstract
Identification at high mass resolution of positive ion at m/z 19 produced by electron-stimulated desorption is presented. Negative ion formation by impact of approximately 100 eV electrons on F-containing molecules occurs primarily by ion-pair formation, for which the cross section is similar to or smaller than that for positive ion formation. It is found that direct electron attachment to a F atom to form F- has an low cross section, even at low electron energy. Authors also considered electron-stimulated desorption (ESD) of O + from TiO2 and advanced a model in which the O, initially residing in the ionic lattice as O2-, participates in an interatomic Auger transition involving a Ti 2p core level ionized by electron or photon impact. Studies have found that the average kinetic energy of the F2+ is twice that of F+.
Original language | English (US) |
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Pages (from-to) | 622-624 |
Number of pages | 3 |
Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 28 |
Issue number | 4 |
DOIs | |
State | Published - Jul 2010 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films