Abstract
Soaked-hydrogen irradiations show the {{rm H}-2} limits for the total-dose and dose-rate response of bipolar technologies. We use an analytical model to extrapolate experimental observations and generate an {{rm H}-2} limits/dose-rate safe-operating-area for various total-dose conditions. Results indicate that 0.1% is the {{rm H}-2} limit that can impact device degradation. We also show that the impact is larger for higher dose levels and that extra care needs to be taken when qualifying electronics for specific missions.
Original language | English (US) |
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Article number | 7346510 |
Pages (from-to) | 2476-2481 |
Number of pages | 6 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 62 |
Issue number | 6 |
DOIs | |
State | Published - Dec 2015 |
Keywords
- Bipolar
- ELDRS
- hydrogen contamination
- packaging
- total dose
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering