@inproceedings{dfb0373cb87f41e78900af83a04f92cc,
title = "High speed redundant self-correcting circuits for radiation hardened by design logic",
abstract = "Self-correcting fine-grained triple redundant circuits using majority gate feedback for single event upset and transient radiation hardening are described and compared to other hardening approaches. The approach votes the triple modular redundant (TMR) state in the state element feedback path, which allows high performance commensurate with commercial integrated circuits. Clock gating is supported. The TMR self-correcting approach is used in a built-in self-test engine to evaluate a 16 k-byte cache design. The circuits have been fabricated on a 90 nm low standby power bulk CMOS process. Data paths have been tested at clock frequencies up to 500 MHz. TID tests using Co-60 indicate negligible standby current increase at over 2 Mrad(Si) and ion tests show SEE hardness beyond 100 MeV-cm2/mg LET.",
keywords = "Radiation hardening by design, microprocessor, redundant systems, registers",
author = "Hindman, {Nathan D.} and Pettit, {David E.} and Patterson, {Dan W.} and Nielsen, {Kyle E.} and Xiaoyin Yao and Keith Holbert and Clark, {Lawrence T.}",
year = "2009",
month = dec,
day = "1",
doi = "10.1109/RADECS.2009.5994697",
language = "English (US)",
isbn = "9781457704932",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
pages = "465--472",
booktitle = "2009 European Conference on Radiation and Its Effects on Components and Systems",
note = "2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 ; Conference date: 14-09-2009 Through 18-09-2009",
}