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Dive into the research topics of 'HIGH RESOLUTION ELECTRON MICROSCOPY OF Si-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE.'. Together they form a unique fingerprint.- Sort by
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David J. Smith, L. A. Freeman, R. A. McMahon, H. Ahmed, M. G. Pitt, T. B. Peters
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution