Abstract
One can use elastically and inelastically scattered electrons and x rays from a sample illuminated by an electron beam to determine the composition and structure of extremely small regions of the sample.
Original language | English (US) |
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Pages | 34-44 |
Number of pages | 11 |
Volume | 34 |
No | 3 |
Specialist publication | Physics Today |
DOIs | |
State | Published - Mar 1981 |
ASJC Scopus subject areas
- General Physics and Astronomy