Abstract
In this work, we study the high critical breakdown field in β-Ga2O3 perpendicular to its (100) crystal plane using a β-Ga2O3/graphene vertical heterostructure. Measurements indicate a record breakdown field of 5.2 MV/cm perpendicular to the (100) plane that is significantly larger than the previously reported values on lateral β-Ga2O3 field-effect-transistors (FETs). This result is compared with the critical field typically measured within the (100) crystal plane, and the observed anisotropy is explained through a combined theoretical and experimental analysis.
Original language | English (US) |
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Article number | 032101 |
Journal | Applied Physics Letters |
Volume | 112 |
Issue number | 3 |
DOIs | |
State | Published - Jan 15 2018 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)